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|Title:||Enhanced pixel by pixel emissivity correction for thermal microscopy|
|Source:||Goh, S.H.,Yim, K.H.,Phang, J.C.H.,Balk, L.J. (2004). Enhanced pixel by pixel emissivity correction for thermal microscopy. Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 : 451-456. ScholarBank@NUS Repository.|
|Abstract:||In thermal microscopy, temperature error arises whenever a constant emissivity value is assumed for different materials. In this paper, we propose a new approach to eliminate these undesirable effects resulting from the ambiguous surface emissivity of materials. This method enables the compensated (true) temperature distribution of a device under test to be obtained from the measured temperature image. A transfer function that relates the measured and true temperature is formed to estimate the actual temperature distribution of a biased device to an accuracy of approximately 0.3-0.7K.|
|Source Title:||Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004|
|Appears in Collections:||Staff Publications|
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