Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/70183
Title: Enhanced pixel by pixel emissivity correction for thermal microscopy
Authors: Goh, S.H.
Yim, K.H.
Phang, J.C.H. 
Balk, L.J.
Issue Date: 2004
Source: Goh, S.H.,Yim, K.H.,Phang, J.C.H.,Balk, L.J. (2004). Enhanced pixel by pixel emissivity correction for thermal microscopy. Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004 : 451-456. ScholarBank@NUS Repository.
Abstract: In thermal microscopy, temperature error arises whenever a constant emissivity value is assumed for different materials. In this paper, we propose a new approach to eliminate these undesirable effects resulting from the ambiguous surface emissivity of materials. This method enables the compensated (true) temperature distribution of a device under test to be obtained from the measured temperature image. A transfer function that relates the measured and true temperature is formed to estimate the actual temperature distribution of a biased device to an accuracy of approximately 0.3-0.7K.
Source Title: Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004
URI: http://scholarbank.nus.edu.sg/handle/10635/70183
ISBN: 0871708078
Appears in Collections:Staff Publications

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