Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.phpro.2008.07.133
Title: Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)
Authors: Khursheed, A. 
Yu, D.
Keywords: Chromatic aberration correction
Electron optical simulation
Time-of-flight electron emission microscope (TOFEEM)
Issue Date: Aug-2008
Source: Khursheed, A., Yu, D. (2008-08). Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM). Physics Procedia 1 (1) : 513-519. ScholarBank@NUS Repository. https://doi.org/10.1016/j.phpro.2008.07.133
Abstract: This paper presents the design of a drift-tube for the purpose of dynamically correcting the chromatic aberration of a time-offlight emission microscope (TOFEEM). Simulations predict that the voltage of an electrode placed at the end of the drift-tube need only vary linearly at a rate of around 0.36 V/ns in order to make the correction and that the final image resolution will be limited primarily by the spherical aberration of the objective lens. © 2008 Elsevier B.V. All rights reserved.
Source Title: Physics Procedia
URI: http://scholarbank.nus.edu.sg/handle/10635/69847
ISSN: 18753884
DOI: 10.1016/j.phpro.2008.07.133
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

12
checked on Dec 10, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.