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|Title:||Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM)|
|Authors:||Khursheed, A. |
|Keywords:||Chromatic aberration correction|
Electron optical simulation
Time-of-flight electron emission microscope (TOFEEM)
|Source:||Khursheed, A., Yu, D. (2008-08). Design of a chromatic aberration corrected time-of-flight electron emission microscope (TOFEEM). Physics Procedia 1 (1) : 513-519. ScholarBank@NUS Repository. https://doi.org/10.1016/j.phpro.2008.07.133|
|Abstract:||This paper presents the design of a drift-tube for the purpose of dynamically correcting the chromatic aberration of a time-offlight emission microscope (TOFEEM). Simulations predict that the voltage of an electrode placed at the end of the drift-tube need only vary linearly at a rate of around 0.36 V/ns in order to make the correction and that the final image resolution will be limited primarily by the spherical aberration of the objective lens. © 2008 Elsevier B.V. All rights reserved.|
|Source Title:||Physics Procedia|
|Appears in Collections:||Staff Publications|
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