Please use this identifier to cite or link to this item:
|Title:||Ge-photodetectors for Si-based optoelectronic integration|
|Authors:||Wang, J. |
|Source:||Wang, J., Lee, S. (2011-01). Ge-photodetectors for Si-based optoelectronic integration. Sensors 11 (1) : 696-718. ScholarBank@NUS Repository. https://doi.org/10.3390/s110100696|
|Abstract:||High speed photodetectors are a key building block, which allow a large wavelength range of detection from 850 nm to telecommunication standards at optical fiber band passes of 1.3-1.55 μm. Such devices are key components in several applications such as local area networks, board to board, chip to chip and intrachip interconnects. Recent technological achievements in growth of high quality SiGe/Ge films on Si wafers have opened up the possibility of low cost Ge-based photodetectors for near infrared communication bands and high resolution spectral imaging with high quantum efficiencies. In this review article, the recent progress in the development and integration of Ge-photodetectors on Si-based photonics will be comprehensively reviewed, along with remaining technological issues to be overcome and future research trends. © 2011 by the authors.|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 13, 2017
WEB OF SCIENCETM
checked on Nov 15, 2017
checked on Dec 16, 2017
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.