Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2359621
Title: Comment on "theoretical analysis of numerical aperture increasing lens microscopy" [ J. Appl. Phys.97, 053105 (2005)]
Authors: Sheppard, C.J.R. 
Huat, G.S.
Issue Date: 2006
Source: Sheppard, C.J.R., Huat, G.S. (2006). Comment on "theoretical analysis of numerical aperture increasing lens microscopy" [ J. Appl. Phys.97, 053105 (2005)]. Journal of Applied Physics 100 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2359621
Abstract: In a recent paper, Ippolito [J. Appl. Phys. 97, 053105 (2005)] analyzed focusing at high numerical aperture into a dielectric medium. They considered three geometries, those of focusing through a level planar interface and through spherical interfaces arranged in concentric or aplanatic positions. The treatment for focusing through a planar interface is based on a different model from that presented elsewhere. It is shown that this model describes the aberration effect only approximately, in contrast to the previous, rigorous treatment. © 2006 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/68173
ISSN: 00218979
DOI: 10.1063/1.2359621
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