Please use this identifier to cite or link to this item:
|Title:||Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]|
|Source:||Lu, Y.-F. (1993). Comment on "Steady-state temperature profile for a thin-film resistor under bias" [J. Appl. Phys. 72, 3862 (1992)]. Journal of Applied Physics 74 (8) : 5290-. ScholarBank@NUS Repository. https://doi.org/10.1063/1.355308|
|Abstract:||This comment is to point out that the temperature dependence of the thermal conductivity should be taken into account in computing the temperature distribution in substrate material (such as silicon) with temperature-dependent thermal conductivity. Ignoring the temperature dependence of the thermal conductivity will lead to a large error in the calculated results.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 11, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.