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|Title:||Analysis of frequency- and temperature-dependent substrate eddy currents in on-chip spiral inductors using the complex image method|
|Keywords:||Complex image method (CIM)|
|Citation:||Kang, K., Shi, J., Yin, W.-Y., Li, L.-W., Zouhdi, S., Rustagi, S.C., Mouthaan, K. (2007-07). Analysis of frequency- and temperature-dependent substrate eddy currents in on-chip spiral inductors using the complex image method. IEEE Transactions on Magnetics 43 (7) : 3243-3253. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2007.897087|
|Abstract:||Using the complex image method (CIM), we have analyzed the frequency and temperature dependencies of substrate eddy currents for single-ended and differential spiral inductors on a lossy silicon substrate. From our analysis, we have derived a set of accurate closed-form expressions for calculating inductances and substrate losses due to substrate eddy currents. Here, we propose a frequency-dependent eleven-element equivalent circuit model based on these formulas. We established the validity of the model by comparing the simulated and measured results, which are in good agreement. © 2007 IEEE.|
|Source Title:||IEEE Transactions on Magnetics|
|Appears in Collections:||Staff Publications|
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