Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))

Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMTT.2010.2052407

DC Field	Value
dc.title	Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261))
dc.contributor.author	Ooi, B.L.
dc.contributor.author	Zhong, Z.
dc.contributor.author	Leong, M.-S.
dc.date.accessioned	2014-06-18T05:32:35Z
dc.date.available	2014-06-18T05:32:35Z
dc.date.issued	2010-08
dc.identifier.citation	Ooi, B.L., Zhong, Z., Leong, M.-S. (2010-08). Erratum: Analytical extraction of extrinsic and intrinsic FET parameters (IEEE Transactions on Microwave Theory and Techniques (2009) 57: 2 (254-261)). IEEE Transactions on Microwave Theory and Techniques 58 (8) : 2314-. ScholarBank@NUS Repository. https://doi.org/10.1109/TMTT.2010.2052407
dc.identifier.issn	00189480
dc.identifier.uri	http://scholarbank.nus.edu.sg/handle/10635/67927
dc.description.uri	http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMTT.2010.2052407
dc.source	Scopus
dc.type	Others
dc.contributor.department	ELECTRICAL & COMPUTER ENGINEERING
dc.description.doi	10.1109/TMTT.2010.2052407
dc.description.sourcetitle	IEEE Transactions on Microwave Theory and Techniques
dc.description.volume	58
dc.description.issue	8
dc.description.page	2314-
dc.description.coden	IETMA
dc.identifier.isiut	000283057400027
Appears in Collections:	Staff Publications

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