Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0143-8166(02)00081-7
Title: ESPI with structured illumination
Authors: Ng, T.W. 
Keywords: Diffractive optics
DOE
ESPI
Non-destructive testing
Speckle
Structured light
Issue Date: Nov-2003
Source: Ng, T.W. (2003-11). ESPI with structured illumination. Optics and Lasers in Engineering 40 (5-6) : 553-561. ScholarBank@NUS Repository. https://doi.org/10.1016/S0143-8166(02)00081-7
Abstract: In practical ESPI applications in industry, the object under investigation often has low reflectance. From theoretical analysis, it is shown here that the implementation of phase shifting techniques will result in a smaller fraction of acceptable measurements for a given level of tolerable phase error. The use of higher power lasers may solve this problem; but it is an expensive solution. In this work, structured lighting using diffractive optical elements is proposed as a cost-effective solution. The approach is particularly useful when the deformation phase has to be obtained from only selected areas on the object. A simple experiment conducted verifies the workability of this approach. © 2002 Published by Elsevier Science Ltd.
Source Title: Optics and Lasers in Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/67763
ISSN: 01438166
DOI: 10.1016/S0143-8166(02)00081-7
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