Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/67749
Title: Cell model for nonlinear fracture analysis - I. Micromechanics calibration
Authors: Faleskog, J.
Gao, X.
Fong Shih, C. 
Keywords: 3-D analysis
Constraint
Crack growth
Experiments
Finite elements
Fracture mechanics
Micromechanics
Resistance curves
Void growth
Issue Date: 1998
Source: Faleskog, J.,Gao, X.,Fong Shih, C. (1998). Cell model for nonlinear fracture analysis - I. Micromechanics calibration. International Journal of Fracture 89 (4) : 355-373. ScholarBank@NUS Repository.
Abstract: A computational approach based on a cell model of material offers real promise as a predictive tool for nonlinear fracture analysis. A key feature of the computational model is the modeling of the material in front of the crack by a layer of similarly-sized cubic cells. Each cell of size D contains a spherical void of initial volume fraction fo. The microseparation characteristics of the material in a cell, a result of void growth and coalescence, is described by the Gurson-Tvergaard constitutive relation; the material outside the layer of cells can be modelled as an elastic-plastic continuum. The success of this computational model hinges on developing a robust calibration scheme of the model parameters. Such a scheme is proposed in this study. The material-specific parameters are calibrated by a two-step micromechanics/fracture-process scheme. This article describes the micromechanics calibration of void growth taking into account both the strain hardening and the strength of the material. The fracture-process calibration is addressed in a companion paper.
Source Title: International Journal of Fracture
URI: http://scholarbank.nus.edu.sg/handle/10635/67749
ISSN: 03769429
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

48
checked on Dec 15, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.