Please use this identifier to cite or link to this item: https://doi.org/4/027
Title: Cantilever deflection profile in scanning probe microscopy
Authors: Ng, T.W. 
Thirunavukkarasu, S.
Issue Date: 1-Jul-2006
Source: Ng, T.W.,Thirunavukkarasu, S. (2006-07-01). Cantilever deflection profile in scanning probe microscopy. European Journal of Physics 27 (4) : 969-973. ScholarBank@NUS Repository. https://doi.org/4/027
Abstract: Experiments that illustrate the operation of scanning probe microscopes are pedagogically beneficial. Here, we describe an experiment that allows students to view the deflection profile of a scanning probe cantilever as a concentrated vertical force is applied at its probe tip. The profile was found to adhere closely to the manner described in the elastic theory of classical mechanics. This simple experiment offers students an invaluable insight into the mechanics of scanning probe microscopy. More importantly, it can be performed easily and economically. © 2006 IOP Publishing Ltd.
Source Title: European Journal of Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/67748
ISSN: 01430807
DOI: 4/027
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

41
checked on Dec 15, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.