Please use this identifier to cite or link to this item: https://doi.org/10.1103/PhysRevB.82.064108
Title: Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films
Authors: Liu, H.
Yao, K.
Yang, P. 
Du, Y.
He, Q.
Gu, Y.
Li, X.
Wang, S.
Zhou, X.
Wang, J. 
Issue Date: 19-Aug-2010
Source: Liu, H., Yao, K., Yang, P., Du, Y., He, Q., Gu, Y., Li, X., Wang, S., Zhou, X., Wang, J. (2010-08-19). Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films. Physical Review B - Condensed Matter and Materials Physics 82 (6) : -. ScholarBank@NUS Repository. https://doi.org/10.1103/PhysRevB.82.064108
Abstract: With increasing film thickness of the epitaxial BiFeO3 (001) films deposited on SrTiO3 substrates from 30 to 720 nm, the crystal structure evolutes from a fully strained tetragonal lattice to partially relaxed monoclinic one with rotated twins. Although the mismatch strain results in a significant lattice distortion and twinning evolution, the polarization does not show a direct correlation with strain. Instead, there is a strong dependence of polarization on the body diagonal length of the distorted pseudocubic unit cell. The distortion in the polarization direction is the critical parameter, other than strain, that determines the polarization in the monoclinic phase ferroelectric thin films. © 2010 The American Physical Society.
Source Title: Physical Review B - Condensed Matter and Materials Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/65047
ISSN: 10980121
DOI: 10.1103/PhysRevB.82.064108
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