Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3106663
Title: Polarization retention on short, intermediate, and long time scales in ferroelectric thin films
Authors: Lou, X.J. 
Issue Date: 2009
Source: Lou, X.J. (2009). Polarization retention on short, intermediate, and long time scales in ferroelectric thin films. Journal of Applied Physics 105 (9) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3106663
Abstract: We developed a model with no adjustable parameter for retention loss at short and long time scales in ferroelectric thin-film capacitors. We found that the predictions of this model are in good agreement with the experimental observations in the literature. In particular, it explains why a power-law function shows better fitting than a linear-log relation on a short time scale (10-7 s to 1 s) and why a stretched exponential relation gives more precise description than a linear-log plot on a long time scale (>100 s), as reported by many researchers in the past. More severe retention losses at higher temperatures and in thinner films have also been correctly predicted by the present theory. © 2009 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/64978
ISSN: 00218979
DOI: 10.1063/1.3106663
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