Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2212052
Title: Morphological stability of the Stranski-Krastanow systems under an electric field
Authors: Chiu, C.-H. 
Poh, C.T.
Huang, Z.
Issue Date: 12-Jun-2006
Source: Chiu, C.-H., Poh, C.T., Huang, Z. (2006-06-12). Morphological stability of the Stranski-Krastanow systems under an electric field. Applied Physics Letters 88 (24) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2212052
Abstract: The morphological stability of the Stranski-Krastanow (SK) system against surface undulation is investigated for the case where the SK system consists of a conductor film and a thick substrate and it is under the influence of an electric field induced by an electrode above the film. It is shown that a flat electrode reduces the critical thickness below which the SK system is completely stable against surface undulation. Applying a wavy electrode to the completely stable system, on the other hand, causes the flat film surface to develop into an equilibrium ripple profile. © 2006 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/64954
ISSN: 00036951
DOI: 10.1063/1.2212052
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