Please use this identifier to cite or link to this item:
https://doi.org/10.1109/24.475974
DC Field | Value | |
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dc.title | Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies | |
dc.contributor.author | Tang, Loon Ching | |
dc.contributor.author | Chang, Dong Shang | |
dc.date.accessioned | 2014-06-17T07:02:24Z | |
dc.date.available | 2014-06-17T07:02:24Z | |
dc.date.issued | 1995-12 | |
dc.identifier.citation | Tang, Loon Ching,Chang, Dong Shang (1995-12). Reliability prediction using nondestructive accelerated-degradation data: Case study on power supplies. IEEE Transactions on Reliability 44 (4) : 562-566. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/24.475974" target="_blank">https://doi.org/10.1109/24.475974</a> | |
dc.identifier.issn | 00189529 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/63293 | |
dc.description.abstract | This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/24.475974 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | INDUSTRIAL & SYSTEMS ENGINEERING | |
dc.description.doi | 10.1109/24.475974 | |
dc.description.sourcetitle | IEEE Transactions on Reliability | |
dc.description.volume | 44 | |
dc.description.issue | 4 | |
dc.description.page | 562-566 | |
dc.description.coden | IEERA | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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