Please use this identifier to cite or link to this item:
|Title:||Degradation-based burn-in with preventive maintenance|
Long run average cost
|Citation:||Ye, Z.-S., Shen, Y., Xie, M. (2012-09-01). Degradation-based burn-in with preventive maintenance. European Journal of Operational Research 221 (2) : 360-367. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ejor.2012.03.028|
|Abstract:||As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the screening decision on the degradation level of a burnt-in unit. Motivated by the infant mortality faced by many Micro-Electro-Mechanical Systems (MEMSs), this study develops two degradation-based joint burn-in and maintenance models under the age and the block based maintenances, respectively. We assume that the product population comprises a weak and a normal subpopulations. Degradation of the product follows Wiener processes with linear drift, while the weak and the normal subpopulations possess distinct drift parameters. The objective of joint burn-in and maintenance decisions is to minimize the long run average cost per unit time during field use by properly choosing the burn-in settings and the preventive replacement intervals. An example using the MEMS devices demonstrates effectiveness of these two models. © 2012 Elsevier B.V. All rights reserved.|
|Source Title:||European Journal of Operational Research|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 26, 2018
WEB OF SCIENCETM
checked on Apr 3, 2018
checked on May 18, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.