Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/62874
DC FieldValue
dc.titleThermal modeling of grooved phase change optical recording disk
dc.contributor.authorHo, J.J.
dc.contributor.authorChong, T.C.
dc.contributor.authorShi, L.P.
dc.contributor.authorLiu, Z.J.
dc.contributor.authorLee, J.C.
dc.date.accessioned2014-06-17T06:55:50Z
dc.date.available2014-06-17T06:55:50Z
dc.date.issued1999
dc.identifier.citationHo, J.J.,Chong, T.C.,Shi, L.P.,Liu, Z.J.,Lee, J.C. (1999). Thermal modeling of grooved phase change optical recording disk. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers 38 (3 B) : 1604-1607. ScholarBank@NUS Repository.
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/62874
dc.description.abstractA new method of studying the laser induced temperature profiles of a multi-layered phase change optical disk is applied to the deep groove disk structure for the first time. The new model takes into consideration the thermal effects generated by both the incident and reflected light. Three-dimensional finite-element modelling and analyses of the new thermal model were carried out using commercial finite-element software MSC/PATRAN and ABAQUS. The calculated temperature differences between the new and the existing model are compared for grooves of depth 80 and 180 nm. Results showed that the reflected light gave rise to a significant temperature difference, especially in the deeper groove. Reduction of cross-erasure in adjacent tracks in a grooved phase change disk structure by using the deep groove method was also investigated. Findings showed that the reflected laser light gave rise to a significant temperature rise at the adjacent track. © 1999 Publication Board, Japanese Journal of Applied Physics.
dc.sourceScopus
dc.subjectFinite-element
dc.subjectGrooved phase change disk structure
dc.subjectOptical data storage
dc.subjectPhase change media
dc.subjectThermal modeling
dc.typeArticle
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
dc.description.volume38
dc.description.issue3 B
dc.description.page1604-1607
dc.description.codenJAPND
dc.identifier.isiutNOT_IN_WOS
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