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https://doi.org/10.1109/55.823578
DC Field | Value | |
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dc.title | Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure | |
dc.contributor.author | Yue, J.M.P. | |
dc.contributor.author | Chim, W.K. | |
dc.contributor.author | Cho, B.J. | |
dc.contributor.author | Chan, D.S.H. | |
dc.contributor.author | Qin, W.H. | |
dc.contributor.author | Kim, Y.-B. | |
dc.contributor.author | Jang, S.-A. | |
dc.contributor.author | Yeo, I.-S. | |
dc.date.accessioned | 2014-06-17T06:49:27Z | |
dc.date.available | 2014-06-17T06:49:27Z | |
dc.date.issued | 2000-03 | |
dc.identifier.citation | Yue, J.M.P.,Chim, W.K.,Cho, B.J.,Chan, D.S.H.,Qin, W.H.,Kim, Y.-B.,Jang, S.-A.,Yeo, I.-S. (2000-03). Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structure. IEEE Electron Device Letters 21 (3) : 130-132. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/55.823578" target="_blank">https://doi.org/10.1109/55.823578</a> | |
dc.identifier.issn | 07413106 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/62290 | |
dc.description.abstract | Narrow-channel n-MOSFET's with recessed LOCOS (R-LOCOS) isolation structure exhibits less hot carrier-induced degradation than wide-channel n-MOSFET's, but the degradation mechanism of both devices is the same. This new finding is explained by the fact that in deep submicron MOSFET's with ultra-thin gate oxide, the dominant factor deciding the degradation behavior in narrow- and wide-channel devices is the vertical electric field effect rather than the mechanical stress effect. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/55.823578 | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.description.doi | 10.1109/55.823578 | |
dc.description.sourcetitle | IEEE Electron Device Letters | |
dc.description.volume | 21 | |
dc.description.issue | 3 | |
dc.description.page | 130-132 | |
dc.description.coden | EDLED | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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