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|Title:||Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures|
|Authors:||Ling, C.H. |
|Source:||Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository.|
|Source Title:||Solid State Electronics|
|Appears in Collections:||Staff Publications|
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