Please use this identifier to cite or link to this item:
|Title:||Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration|
|Authors:||Chan, Daniel S.H. |
Ong, Vincent K.S.
Phang, Jacob C.H.
|Source:||Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. (1995-05). Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration. IEEE Transactions on Electron Devices 42 (5) : 963-968. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381995|
|Abstract:||A direct method of extracting bulk minority carrier diffusion length and surface recombination velocity from an EBIC line scan in the planar configuration is described. The accuracy of the method is verified by 3-D computer simulation and compared with existing methods. It was found that this method is much simpler to use and gives better accuracy than existing methods.|
|Source Title:||IEEE Transactions on Electron Devices|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 6, 2017
WEB OF SCIENCETM
checked on Nov 17, 2017
checked on Dec 10, 2017
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.