Please use this identifier to cite or link to this item: https://doi.org/10.1109/16.381995
Title: Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration
Authors: Chan, Daniel S.H. 
Ong, Vincent K.S. 
Phang, Jacob C.H. 
Issue Date: May-1995
Source: Chan, Daniel S.H., Ong, Vincent K.S., Phang, Jacob C.H. (1995-05). Direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration. IEEE Transactions on Electron Devices 42 (5) : 963-968. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381995
Abstract: A direct method of extracting bulk minority carrier diffusion length and surface recombination velocity from an EBIC line scan in the planar configuration is described. The accuracy of the method is verified by 3-D computer simulation and compared with existing methods. It was found that this method is much simpler to use and gives better accuracy than existing methods.
Source Title: IEEE Transactions on Electron Devices
URI: http://scholarbank.nus.edu.sg/handle/10635/62049
ISSN: 00189383
DOI: 10.1109/16.381995
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