Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/61738
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dc.titleAcoustic wave monitoring of cleaning and ablation during excimer laser interaction with copper surfaces
dc.contributor.authorLu, Y.F.
dc.contributor.authorLee, Y.P.
dc.contributor.authorHong, M.H.
dc.contributor.authorLow, T.S.
dc.date.accessioned2014-06-17T06:43:26Z
dc.date.available2014-06-17T06:43:26Z
dc.date.issued1997-09
dc.identifier.citationLu, Y.F.,Lee, Y.P.,Hong, M.H.,Low, T.S. (1997-09). Acoustic wave monitoring of cleaning and ablation during excimer laser interaction with copper surfaces. Applied Surface Science 119 (1-2) : 137-146. ScholarBank@NUS Repository.
dc.identifier.issn01694332
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/61738
dc.description.abstractAcoustic wave generation during excimer laser interaction with copper substrates has been investigated. It is found that the amplitudes of acoustic waves depend on laser fluence, pulse number and surface condition of the substrate and can be used to determine the nature of laser-material interactions such as pulsed-laser-induced cleaning, surface roughening and ablation. When laser fluence is below the ablation threshold of copper, the amplitudes are reduced to zero due to the cleaning of surface contaminants but increase again due to surface roughening if the fluence is large enough. As laser fluence becomes higher than the ablation threshold, the amplitudes of acoustic waves also reduce with increasing pulse number but to a level larger than zero due to laser ablation and then increase again due to surface morphology change. By establishing a relationship between the amplitudes and laser-substrate parameters, i.e., bulk response, surface response, pulse dependence and morphology response, a numerical formula is proposed for real-time monitoring of laser-solid interaction. The bulk response can be used to determine the ablation threshold. The morphology response is found to reach the maximum at the ablation threshold. © 1997 Elsevier Science B.V.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleApplied Surface Science
dc.description.volume119
dc.description.issue1-2
dc.description.page137-146
dc.description.codenASUSE
dc.identifier.isiutNOT_IN_WOS
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