Please use this identifier to cite or link to this item: https://doi.org/1/015301
Title: Texturing of UHMWPE surface via NIL for low friction and wear properties
Authors: Kustandi, T.S.
Choo, J.H.
Low, H.Y.
Sinha, S.K. 
Issue Date: 2010
Source: Kustandi, T.S.,Choo, J.H.,Low, H.Y.,Sinha, S.K. (2010). Texturing of UHMWPE surface via NIL for low friction and wear properties. Journal of Physics D: Applied Physics 43 (1) : -. ScholarBank@NUS Repository. https://doi.org/1/015301
Abstract: Wear is a major obstacle limiting the useful life of implanted ultra-high molecular weight polyethylene (UHMWPE) components in total joint arthroplasty. It has been a continuous effort in the implant industry to reduce the frictional wear problem of UHMWPE by improving the structure, morphology and mechanical properties of the polymer. In this paper, a new paradigm that utilizes nanoimprint lithography (NIL) in producing textures on the surface of UHMWPE is proposed to efficiently improve the tribological properties of the polymer. Friction and wear experiments were conducted on patterned and controlled (non-patterned) UHMWPE surfaces using a commercial tribometer, mounted with a silicon nitride ball, under a dry-sliding condition with normal loads ranging from 60 to 200 mN. It has been shown that the patterned UHMWPE surface showed a reduction in the coefficient of friction between 8% and 35% as compared with the controlled (non-patterned) surface, depending on the magnitude of the normal load. Reciprocating wear experiments also showed that the presence of surface textures on the polymer resulted in lower wear depth and width, with minimal material transfer to the sliding surface. © 2010 IOP Publishing Ltd.
Source Title: Journal of Physics D: Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/61473
ISSN: 00223727
DOI: 1/015301
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

25
checked on Dec 7, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.