Please use this identifier to cite or link to this item: https://doi.org/10.1117/1.2205892
Title: Study on the use of white light interferometry for multifiber-end surface profile measurement
Authors: Quan, C. 
Wang, S.H. 
Tay, C.J. 
Reading, I.
Keywords: Michelson interferometric microscope
Microcomponents
Multifiber array
Three-dimensional whole field inspection
White light interferometry
Issue Date: May-2006
Source: Quan, C., Wang, S.H., Tay, C.J., Reading, I. (2006-05). Study on the use of white light interferometry for multifiber-end surface profile measurement. Optical Engineering 45 (5) : -. ScholarBank@NUS Repository. https://doi.org/10.1117/1.2205892
Abstract: An optical microscopic system for measuring multifiber-end surface based on scanning white light interferometer is described. The designed Michelson interferometric configuration in which light reflectivity of a reference flat is selected to match that of a test surface enables a better contrast of the resulting interference fringes to be recorded. A local peak comparison approach is used to determine a fractional phase from the best-focus frame of a correlogram acquired by a vertical scanning achieved with a piezoelectric translator (PZT). The whole field measurement on a 12-fiber array of the plastic ferrule with a low reflective, rough, and discontinuous surface is implemented. Experimental results show that surface geometric profile on a multifiber-end is measurable. Comparison with measurements on standard calibrated objects shows that the accuracy of the proposed system is comparable with that of existing white light interferometer and atomic force microscope. © 2006 Society of Photo-Optical Instrumentation Engineers.
Source Title: Optical Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/61419
ISSN: 00913286
DOI: 10.1117/1.2205892
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