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|Title:||In situ surface roughness measurement using a laser scattering method|
|Authors:||Tay, C.J. |
|Keywords:||In situ measurement|
|Citation:||Tay, C.J., Wang, S.H., Quan, C., Shang, H.M. (2003-03-15). In situ surface roughness measurement using a laser scattering method. Optics Communications 218 (1-3) : 1-10. ScholarBank@NUS Repository. https://doi.org/10.1016/S0030-4018(03)01102-7|
|Abstract:||In this paper, the design and development of an optical probe for in situ measurement of surface roughness are discussed. Based on this light scattering principle, the probe which consists of a laser diode, measuring lens and a linear photodiode array, is designed to capture the scattered light from a test surface with a relatively large scattering angle φ (=28°). This capability increases the measuring range and enhances repeatability of the results. The coaxial arrangement that incorporates a dual-laser beam and a constant compressed air stream renders the proposed system insensitive to movement or vibration of the test surface as well as surface conditions. Tests were conducted on workpieces which were mounted on a turning machine that operates with different cutting speeds. Test specimens which underwent different machining processes and of different surface finish were also studied. The results obtained demonstrate the feasibility of surface roughness measurement using the proposed method. © 2003 Published by Elsevier Science B.V.|
|Source Title:||Optics Communications|
|Appears in Collections:||Staff Publications|
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