Please use this identifier to cite or link to this item: https://doi.org/10.1364/OL.30.002101
Title: Fringe projection profilometry with nonparallel illumination: A least-squares approach
Authors: Chen, L.
Quan, C. 
Issue Date: 15-Aug-2005
Source: Chen, L., Quan, C. (2005-08-15). Fringe projection profilometry with nonparallel illumination: A least-squares approach. Optics Letters 30 (16) : 2101-2103. ScholarBank@NUS Repository. https://doi.org/10.1364/OL.30.002101
Abstract: Under a nonparallel illumination condition, fringe patterns projected on an object have unequal fringe spacing that would introduce a nonlinear carrier phase component. This Letter describes a nonlinear carrier removal technique based on a least-squares approach. In contrast with conventional methods, the proposed algorithm would not magnify phase measurement uncertainty, nor does it require direct estimation of system geometrical parameters. The theoretical expression of the carrier phase function on the reference is derived and expanded in a power series. The unknown coefficients in the series are determined by a least-squares method. By subtracting the calculated carrier phase function from the unwrapped phase map, the phase distribution of the object profile is obtained. © 2005 Optical Society of America.
Source Title: Optics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/60378
ISSN: 01469592
DOI: 10.1364/OL.30.002101
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