Please use this identifier to cite or link to this item:
|Title:||Finite element analysis of interface delamination and buckling in thin film systems by wedge indentation|
|Citation:||Liu, P., Zhang, Y.W., Zeng, K.Y., Lu, C., Lam, K.Y. (2007-05). Finite element analysis of interface delamination and buckling in thin film systems by wedge indentation. Engineering Fracture Mechanics 74 (7) : 1118-1125. ScholarBank@NUS Repository. https://doi.org/10.1016/j.engfracmech.2006.12.025|
|Abstract:||A finite element method is used to study the interface delamination and buckling of thin film systems subject to microwedge indentation. In the formulation, the interface adjoining the thin film and substrate is assumed to be the only site where cracking may occur. Both the thin film and the substrate are taken to be ductile materials with finite deformation. A traction-separation law, with two major parameters: interface strength and interface energy, is introduced to simulate the adhesive and failure behaviors of the interface between the film and the substrate. The effects of the interface adhesive properties and the thickness of the thin film on the onset and growth of interface delamination and the film buckling are investigated. © 2007 Elsevier Ltd. All rights reserved.|
|Source Title:||Engineering Fracture Mechanics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 19, 2018
WEB OF SCIENCETM
checked on Jul 3, 2018
checked on Jul 6, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.