Experimental determination of micromachined discrete and continuous device spring constants using nanoindentation method
Chan, M.L. Tay, F.E.H. Logeeswaran, V.J. Zeng, K.Y. Shen, L. Chau, F.S.
Chan, M.L.
Zeng, K.Y.
Shen, L.
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Abstract
A rapid and accurate static and quasi-static method for determining the out-of-plane spring constants of cantilevers and a micromachined vibratory sensor is presented. In the past much of the effort in nanoindentation application was to investigate the thin-film mechanical properties. In this paper, we have utilized the nanoindentation method to measure directly some micromachined device (e.g. microgyroscope) spring constants. The cantilevers and devices tested were fabricated using the MUMPS process and an SOI process (patent pending). Spring constants are determined using a commercial nanoindentation apparatus UMIS-2000 configured with both Berkovich and spherical indenter tip that can be placed onto the device with high accuracy. Typical load resolution is: 20 μN to 0.5 N and a displacement resolution of 0.05 nm. Information was deduced from the penetration depth versus load curves during both loading and unloading.
Keywords
Bending test, Cantilever, Microgyroscope, Nanoindentation, Spring constant
Source Title
Analog Integrated Circuits and Signal Processing
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Series/Report No.
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Date
2003-10
DOI
10.1023/A:1024824818808
Type
Article