Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/58689
Title: Shearographic and holographic assessment of defective laminates with bond-lines of different elasticities
Authors: Shang, H.M. 
Tham, L.M.
Chau, F.S. 
Issue Date: Jul-1995
Source: Shang, H.M.,Tham, L.M.,Chau, F.S. (1995-07). Shearographic and holographic assessment of defective laminates with bond-lines of different elasticities. Journal of Engineering Materials and Technology, Transactions of the ASME 117 (3) : 322-329. ScholarBank@NUS Repository.
Abstract: While defects in laminated plates are readily revealed using double-exposure shearography and holography, when an incremental vacuum pressure is applied between the exposures, the apparent defect size, measured from the boundary of the perturbed fringes, may over-estimate the actual defect size depending on the elasticity of the bond-line. In this paper, the perturbed fringes were described by a mathematical model derived from the theory of thin plates supported by a Winkler type elastic foundation which takes into consideration the elasticity of the bond-line. An iterative technique is subsequently presented for estimating the size and depth of the defect from the fringe pattern without the need to pre-determine the current elasticity of the bond-line. Laminates with a thick and highly elastic bond-line, found in foam-adhesive bonded metal laminates, and those with a thin and brittle bond-line, found in multi-layered glassfibre reinforced plastic plates, were tested. Results have shown that the defects in these laminates were accurately assessed.
Source Title: Journal of Engineering Materials and Technology, Transactions of the ASME
URI: http://scholarbank.nus.edu.sg/handle/10635/58689
ISSN: 00944289
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

41
checked on Dec 15, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.