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|Title:||Defects detection of plates using comparative digital speckle pattern interferometry|
|Authors:||Tay, C.J. |
|Citation:||Tay, C.J.,Shang, H.M.,Quan, C. (2000). Defects detection of plates using comparative digital speckle pattern interferometry. Optik (Jena) 111 (12) : 536-540. ScholarBank@NUS Repository.|
|Abstract:||The paper presents a method to determine defects in the form of local thinning on regions of a plate using comparative digital speckle pattern interferometry (DSPI). For a plate where no fringe compensation is applied, the resulting fringe pattern often appears as a series of overcrowded fringes and the location and size of the defects are difficult to determine. However, when fringe compensation is applied, the overcrowded fringes are removed leaving only fringes indicating the defective region. Square plates containing simulated defects in the form of circular localized thinning are inspected by the comparative DSPI technique. With an incremental uniform pressure applied to both the master and test objects, defects which are often difficult to detect are readily revealed. Theory of the method and experimental results are presented.|
|Source Title:||Optik (Jena)|
|Appears in Collections:||Staff Publications|
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