Please use this identifier to cite or link to this item: https://doi.org/6/038
Title: Wafer-level ordered arrays of aligned carbon nanotubes with controlled size and spacing on silicon
Authors: Krishnan, R.
Nguyen, H.Q.
Thompson, C.V.
Choi, W.K. 
Foo, Y.L.
Issue Date: 1-Jun-2005
Source: Krishnan, R.,Nguyen, H.Q.,Thompson, C.V.,Choi, W.K.,Foo, Y.L. (2005-06-01). Wafer-level ordered arrays of aligned carbon nanotubes with controlled size and spacing on silicon. Nanotechnology 16 (6) : 841-845. ScholarBank@NUS Repository. https://doi.org/6/038
Abstract: Aligned carbon nanotubes with uniform outer diameters, ordered over wafer-scale areas were fabricated using porous alumina templates on silicon. Anodization of aluminium films deposited on corrugated silicon surfaces, patterned using interference lithography, led to periodic pore structures over wafer-scale areas with controlled spacing and symmetry, and with pore sizes independently controlled through the anodization conditions. Nickel deposited at the base of the pores catalysed CNT growth during PECVD. These results demonstrate a wafer-scale approach to the control of the size, pitch, ordering symmetry, and position of nanotubes and nanowires in a rigid insulating scaffold. © 2005 IOP Publishing Ltd.
Source Title: Nanotechnology
URI: http://scholarbank.nus.edu.sg/handle/10635/57792
ISSN: 09574484
DOI: 6/038
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

61
checked on Dec 8, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.