Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4769042
DC FieldValue
dc.titleUniversal scaling of resistivity in bilayer graphene
dc.contributor.authorGopinadhan, K.
dc.contributor.authorJun Shin, Y.
dc.contributor.authorYang, H.
dc.date.accessioned2014-06-17T03:09:49Z
dc.date.available2014-06-17T03:09:49Z
dc.date.issued2012-11-26
dc.identifier.citationGopinadhan, K., Jun Shin, Y., Yang, H. (2012-11-26). Universal scaling of resistivity in bilayer graphene. Applied Physics Letters 101 (22) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4769042
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57754
dc.description.abstractWe report the temperature dependent electrical transport properties of gated bilayer graphene devices. We see a clear evidence of insulating behavior due to electron-hole charge puddles. The electrical resistivity increases while the mobility decreases with decreasing temperature, a characteristic due to carrier inhomogeneity in graphene. The theoretical fittings using an empirical formula of single electron tunneling indicate that electrical resistivity follows a universal curve with a scaling parameter. The scaling parameter is determined to be a measure of the fluctuations in the electron-hole puddle distribution. © 2012 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4769042
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.4769042
dc.description.sourcetitleApplied Physics Letters
dc.description.volume101
dc.description.issue22
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000311967000072
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