Please use this identifier to cite or link to this item: https://doi.org/10.1364/AO.50.000G74
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dc.titleTuning of localized surface plasmon resonance of well-ordered Ag/Au bimetallic nanodot arrays by laser interference lithography and thermal annealing
dc.contributor.authorXu, L.
dc.contributor.authorTan, L.S.
dc.contributor.authorHong, M.H.
dc.date.accessioned2014-06-17T03:09:25Z
dc.date.available2014-06-17T03:09:25Z
dc.date.issued2011-11-01
dc.identifier.citationXu, L., Tan, L.S., Hong, M.H. (2011-11-01). Tuning of localized surface plasmon resonance of well-ordered Ag/Au bimetallic nanodot arrays by laser interference lithography and thermal annealing. Applied Optics 50 (31) : G74-G79. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.50.000G74
dc.identifier.issn00036935
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57720
dc.description.abstractA novel hybrid approach to fabricate large-area well-ordered Ag/Au bimetallic nanodot arrays and its potential applications for biosensing is investigated. With the combination of laser interference lithography and the thermal annealing technique, Ag/Au bimetallic nanodots about ∼50 nm are formed inside periodic nanodisk arrays at a dimension of ∼530 nm on quartz substrates. Extinction spectra of the fabricated nanostructures show their localized surface plasmon resonance (LSPR) can be well controlled by Au concentration, which offers a means to flexibly tune the optical properties of the nanodot arrays. To study the sensitivity of the nanodot arrays, resonance wavelength changes per refractive index unit (RIU) are performed in different surrounding environments. This shows a 94% increase in peak shift per refractive index unit (nanometers/RIU) compared to the nanodot arrays formed only by thermal annealing. These results demonstrate a feasible approach to improve LSPR-based biosensor performance. © 2011 Optical Society of America.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1364/AO.50.000G74
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1364/AO.50.000G74
dc.description.sourcetitleApplied Optics
dc.description.volume50
dc.description.issue31
dc.description.pageG74-G79
dc.description.codenAPOPA
dc.identifier.isiut000297162700014
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