Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.nima.2005.09.028
Title: Simulation of magnetic sector deflector aberration properties for low-energy electron microscopy
Authors: Osterberg, M. 
Khursheed, A. 
Keywords: Aberrations
Computer simulations
Electron microscopy
Electron spectroscopy
Magnetic sector deflector
Issue Date: 15-Dec-2005
Citation: Osterberg, M., Khursheed, A. (2005-12-15). Simulation of magnetic sector deflector aberration properties for low-energy electron microscopy. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 555 (1-2) : 20-30. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nima.2005.09.028
Abstract: In this paper, low-order aberration properties of magnetic sector deflectors are analysed by computer simulation and their use in the low-energy electron microscope (LEEM) and the spectroscopic scanning electron microscope (SPSSEM) is examined. The simulation method is based upon direct ray tracing through field distributions derived by the finite element method and semi-analytical techniques. A variety of beam conditions and geometries have been investigated in order to operate the sector as a round lens while deflecting the primary beam through 90°. Predicted results from this study are also compared to previous simulation work. © 2005 Elsevier B.V. All rights reserved.
Source Title: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
URI: http://scholarbank.nus.edu.sg/handle/10635/57410
ISSN: 01689002
DOI: 10.1016/j.nima.2005.09.028
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