Please use this identifier to cite or link to this item:
https://doi.org/10.1049/el.2013.2092
Title: | Sample-and-hold circuit with dynamic switch leakage compensation |
Authors: | Zou, L. Pathrose, J. Chai, K.T.C. Je, M. Xu, Y.P. |
Issue Date: | 10-Oct-2013 |
Citation: | Zou, L., Pathrose, J., Chai, K.T.C., Je, M., Xu, Y.P. (2013-10-10). Sample-and-hold circuit with dynamic switch leakage compensation. Electronics Letters 49 (21) : 1323-1325. ScholarBank@NUS Repository. https://doi.org/10.1049/el.2013.2092 |
Abstract: | For sample-and-hold (S/H) circuits operating at low sampling rate and high temperature, the switch leakage current is one of the major error sources. A S/H circuit with dynamic switch leakage compensation is presented. The proposed leakage current compensation circuit generates switch leakage replicas that track the actual leakages in the sampling switches. A bidirectional current steering circuit allows the switch leakage to be dynamically compensated with the leakage replicas. A prototype S/H circuit is fabricated in a 1 ?m silicon-onisolation CMOS technology. Measurement has shown the effectiveness of dynamic leakage current compensation up to 280C with a maximum 75% leakage reduction. © The Institution of Engineering and Technology 2013. |
Source Title: | Electronics Letters |
URI: | http://scholarbank.nus.edu.sg/handle/10635/57325 |
ISSN: | 00135194 |
DOI: | 10.1049/el.2013.2092 |
Appears in Collections: | Staff Publications |
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