Please use this identifier to cite or link to this item: https://doi.org/10.1049/el.2013.2092
Title: Sample-and-hold circuit with dynamic switch leakage compensation
Authors: Zou, L.
Pathrose, J.
Chai, K.T.C.
Je, M.
Xu, Y.P. 
Issue Date: 10-Oct-2013
Source: Zou, L., Pathrose, J., Chai, K.T.C., Je, M., Xu, Y.P. (2013-10-10). Sample-and-hold circuit with dynamic switch leakage compensation. Electronics Letters 49 (21) : 1323-1325. ScholarBank@NUS Repository. https://doi.org/10.1049/el.2013.2092
Abstract: For sample-and-hold (S/H) circuits operating at low sampling rate and high temperature, the switch leakage current is one of the major error sources. A S/H circuit with dynamic switch leakage compensation is presented. The proposed leakage current compensation circuit generates switch leakage replicas that track the actual leakages in the sampling switches. A bidirectional current steering circuit allows the switch leakage to be dynamically compensated with the leakage replicas. A prototype S/H circuit is fabricated in a 1 ?m silicon-onisolation CMOS technology. Measurement has shown the effectiveness of dynamic leakage current compensation up to 280C with a maximum 75% leakage reduction. © The Institution of Engineering and Technology 2013.
Source Title: Electronics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/57325
ISSN: 00135194
DOI: 10.1049/el.2013.2092
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