Point-dipole response from a magnetic force microscopy tip with a synthetic antiferromagnetic coating

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1560863

Title:	Point-dipole response from a magnetic force microscopy tip with a synthetic antiferromagnetic coating
Authors:	Wu, Y. Shen, Y. Liu, Z. Li, K. Qiu, J.
Issue Date:	17-Mar-2003
Citation:	Wu, Y., Shen, Y., Liu, Z., Li, K., Qiu, J. (2003-03-17). Point-dipole response from a magnetic force microscopy tip with a synthetic antiferromagnetic coating. Applied Physics Letters 82 (11) : 1748-1750. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1560863
Abstract:	An antiferromagnetically coupled synthetic structure is used to study a point-dipole-like magnetic force microscopy tip. The synthetic structure consisted of two CoCrPt layers separated by an ultrathin Ru layer. This is achieved through magnetizing one of the CoCrPt layers in either upward or downward direction along the tip axis while the other in the opposite direction through antiferromagnetic coupling.
Source Title:	Applied Physics Letters
URI:	http://scholarbank.nus.edu.sg/handle/10635/57080
ISSN:	00036951
DOI:	10.1063/1.1560863
Appears in Collections:	Staff Publications

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