Please use this identifier to cite or link to this item:
|Title:||Near-field detection of photon emission from silicon with 30 nm spatial resolution|
|Source:||Isakov, D., Tio, A.A.B., Geinzer, T., Phang, J.C.H., Zhang, Y., Balk, L.J. (2008-08). Near-field detection of photon emission from silicon with 30 nm spatial resolution. Microelectronics Reliability 48 (8-9) : 1285-1288. ScholarBank@NUS Repository. https://doi.org/10.1016/j.microrel.2008.07.021|
|Abstract:||We demonstrate a scanning near-field photon emission microscope (SNPEM) for monitoring photon emission sites with spatial resolution beyond the diffraction limit. Success of SNPEM analysis strongly depends on the sensitivity of photon emission detection. We show that scattering dielectric probe (SDP) is capable of providing both sub-100 nm resolution and compatible sensitivity at emission wavelengths between 1 μm and 1.4 μm. We propose a two step fabrication method which avoids any metal coating and ensures repeatability of parameters of different probes. We also predict that fabrication of SDP from a multi-mode fiber instead of a single mode fiber can significantly improve the collection efficiency of the probe. © 2008 Elsevier Ltd. All rights reserved.|
|Source Title:||Microelectronics Reliability|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 15, 2018
WEB OF SCIENCETM
checked on Feb 5, 2018
checked on Feb 19, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.