Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3070637
Title: Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam
Authors: Chen, Y.J.
Huang, T.L.
Leong, S.H.
Hu, S.B.
Ng, K.W.
Yuan, Z.M.
Zong, B.Y.
Shi, J.Z.
Hendra, S.K.
Liu, B.
Ng, V. 
Issue Date: 2009
Source: Chen, Y.J.,Huang, T.L.,Leong, S.H.,Hu, S.B.,Ng, K.W.,Yuan, Z.M.,Zong, B.Y.,Shi, J.Z.,Hendra, S.K.,Liu, B.,Ng, V. (2009). Magnetic force microscopy and spinstand testing of multi-row-per-track discrete bit patterned media fabricated by focused ion beam. Journal of Applied Physics 105 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3070637
Abstract: Multi-row-per-track discrete bit patterned media with interleaved bits have been fabricated on granular perpendicular media disks by focused ion beam and tested by magnetic force microscopy and spinstand tester. It was found that sub-100 nm patterned magnetic islands showed single domain behavior and narrowed switching field distribution. We further demonstrate from captured spinstand readback waveforms the concept of recording two rows of interleaved dot bits as one track. In addition to overcoming the down track patterning resolution limit, the proposed concept patterned media provide many other advantages including higher data rate for read/write, a flexible bit aspect ratio (BAR) 2 design for better integration with head design and servo control, as well as allowing the use of wider write pole to improve writing efficiency for high density recording. © 2009 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/56551
ISSN: 00218979
DOI: 10.1063/1.3070637
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