Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jallcom.2006.02.112
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dc.titleLarge-area parallel near-field optical nanopatterning of functional materials using microsphere mask
dc.contributor.authorChen, G.X.
dc.contributor.authorHong, M.H.
dc.contributor.authorLin, Y.
dc.contributor.authorWang, Z.B.
dc.contributor.authorNg, D.K.T.
dc.contributor.authorXie, Q.
dc.contributor.authorTan, L.S.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-06-17T02:54:47Z
dc.date.available2014-06-17T02:54:47Z
dc.date.issued2008-01-31
dc.identifier.citationChen, G.X., Hong, M.H., Lin, Y., Wang, Z.B., Ng, D.K.T., Xie, Q., Tan, L.S., Chong, T.C. (2008-01-31). Large-area parallel near-field optical nanopatterning of functional materials using microsphere mask. Journal of Alloys and Compounds 449 (1-2) : 265-268. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jallcom.2006.02.112
dc.identifier.issn09258388
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56456
dc.description.abstractLarge-area parallel near-field optical nanopatterning on functional material surfaces was investigated with KrF excimer laser irradiation. A monolayer of silicon dioxide microspheres was self-assembled on the sample surfaces as the processing mask. Nanoholes and nanospots were obtained on silicon surfaces and thin silver films, respectively. The nanopatterning results were affected by the refractive indices of the surrounding media. Near-field optical enhancement beneath the microspheres is the physical origin of nanostructure formation. Theoretical calculation was performed to study the intensity of optical field distributions under the microspheres according to the light scattering model of a sphere on the substrate. © 2006 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jallcom.2006.02.112
dc.sourceScopus
dc.subjectLaser processing
dc.subjectMicrospheres
dc.subjectNanopatterning
dc.subjectNear-field effects
dc.subjectScanning electron microscopy
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.description.doi10.1016/j.jallcom.2006.02.112
dc.description.sourcetitleJournal of Alloys and Compounds
dc.description.volume449
dc.description.issue1-2
dc.description.page265-268
dc.description.codenJALCE
dc.identifier.isiut000252737500061
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