Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2884534
DC FieldValue
dc.titleInvestigation of the V-pit related morphological and optical properties of InGaNGaN multiple quantum wells
dc.contributor.authorLin, F.
dc.contributor.authorXiang, N.
dc.contributor.authorChen, P.
dc.contributor.authorChow, S.Y.
dc.contributor.authorChua, S.J.
dc.date.accessioned2014-06-17T02:54:13Z
dc.date.available2014-06-17T02:54:13Z
dc.date.issued2008
dc.identifier.citationLin, F., Xiang, N., Chen, P., Chow, S.Y., Chua, S.J. (2008). Investigation of the V-pit related morphological and optical properties of InGaNGaN multiple quantum wells. Journal of Applied Physics 103 (4) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2884534
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56406
dc.description.abstractIn this work, the effects of large V-pits on the morphological and optical properties of InGaNGaN multiple quantum wells (MQWs) were studied using scanning electron microscopy, transmission electron microscopy, and photoluminescence. InGaNGaN MQWs with high-density large V-pits were grown by metal organic chemical vapor deposition. In addition to the regular c -plane MQWs, the MQWs grown on the {10 1- 1} faceted sidewalls of the V-pits were also observed, which gave much higher emission energies than those of the c -plane MQWs. Furthermore, when the lowerature GaN buffer was very thin, the {11 2- m} (m2) faceted sidewalls of the V-pits were observed. It was then found that MQWs grown on such sidewalls had emission energies between those of the c -plane MQWs and those of the {10 1- 1} faceted sidewall MQWs. © 2008 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2884534
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentSOLAR ENERGY RESEARCH INST OF S'PORE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.2884534
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume103
dc.description.issue4
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000254191300016
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