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|Title:||Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopy|
|Citation:||Ni, H.Q., Lu, Y.F., Liu, Z.Y., Qiu, H., Wang, W.J., Ren, Z.M., Chow, S.K., Jie, Y.X. (2001-08-06). Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopy. Applied Physics Letters 79 (6) : 812-814. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1391225|
|Abstract:||We have grown Li-doped ZnO films on silicon (100) using the rf planar magnetron sputtering method. The surface charges induced piezoelectrically by defect and by polarization can be observed by electric force microscopy. The Li-doped ZnO films have been proven to be ferroelectric. The Raman spectra of ZnO and Li-doped ZnO films have been measured. © 2001 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
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