Please use this identifier to cite or link to this item: https://doi.org/10.1364/JOSAA.27.000245
Title: Influence of multiple scattering on subwavelength imaging: Transverse electric case
Authors: Chen, X. 
Zhong, Y. 
Issue Date: 1-Feb-2010
Source: Chen, X.,Zhong, Y. (2010-02-01). Influence of multiple scattering on subwavelength imaging: Transverse electric case. Journal of the Optical Society of America A: Optics and Image Science, and Vision 27 (2) : 245-250. ScholarBank@NUS Repository. https://doi.org/10.1364/JOSAA.27.000245
Abstract: This paper uses the Cramér-Rao bound (CRB) to investigate the role of multiple scattering in the framework of transverse electric (TE) electromagnetic inverse scattering. The surface mode in the TE scattering case enables a strong multiple scattering effect even if the scatterers are widely separated. We show that multiple scattering does not always improve the accuracy of the estimation, compared with that expected with a fictitious single scattering model. The reason for the aforementioned conclusion is discussed. Two scenarios that favor the multiple scattering effect are discussed, and the differences between these scenarios and the CRB analysis are highlighted. © 2010 Optical Society of America.
Source Title: Journal of the Optical Society of America A: Optics and Image Science, and Vision
URI: http://scholarbank.nus.edu.sg/handle/10635/56326
ISSN: 10847529
DOI: 10.1364/JOSAA.27.000245
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