Please use this identifier to cite or link to this item:
|Title:||Influence of multiple scattering on subwavelength imaging: Transverse electric case|
|Authors:||Chen, X. |
|Source:||Chen, X.,Zhong, Y. (2010-02-01). Influence of multiple scattering on subwavelength imaging: Transverse electric case. Journal of the Optical Society of America A: Optics and Image Science, and Vision 27 (2) : 245-250. ScholarBank@NUS Repository. https://doi.org/10.1364/JOSAA.27.000245|
|Abstract:||This paper uses the Cramér-Rao bound (CRB) to investigate the role of multiple scattering in the framework of transverse electric (TE) electromagnetic inverse scattering. The surface mode in the TE scattering case enables a strong multiple scattering effect even if the scatterers are widely separated. We show that multiple scattering does not always improve the accuracy of the estimation, compared with that expected with a fictitious single scattering model. The reason for the aforementioned conclusion is discussed. Two scenarios that favor the multiple scattering effect are discussed, and the differences between these scenarios and the CRB analysis are highlighted. © 2010 Optical Society of America.|
|Source Title:||Journal of the Optical Society of America A: Optics and Image Science, and Vision|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 12, 2017
checked on Dec 15, 2017
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.