Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3581042
Title: Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field
Authors: Jiang, J.
Zeng, D.G.
Chung, K.-W.
Kim, J.
Bae, S. 
Issue Date: 18-Apr-2011
Source: Jiang, J., Zeng, D.G., Chung, K.-W., Kim, J., Bae, S. (2011-04-18). Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field. Applied Physics Letters 98 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3581042
Abstract: It was observed that electromigration (EM)-induced failures in spin valve multilayers were severely accelerated by an externally applied magnetic field. The theoretical and experimental analysis results confirmed that Hall effect-induced Lorentz force applied to the perpendicular-to-the-film-plane direction is primarily responsible for the severe acceleration of the EM failures due to its dominant contribution to abruptly increasing local temperature and current density. The proposed failure model and the theoretical calculations were demonstrated to agree well with the experimental observations. © 2011 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/56172
ISSN: 00036951
DOI: 10.1063/1.3581042
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

3
checked on Mar 7, 2018

WEB OF SCIENCETM
Citations

4
checked on Mar 7, 2018

Page view(s)

33
checked on Feb 25, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.