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Title: Field-emission properties of ultrathin 5 nm tungsten nanowire
Authors: Yeong, K.S.
Thong, J.T.L. 
Issue Date: 2006
Citation: Yeong, K.S., Thong, J.T.L. (2006). Field-emission properties of ultrathin 5 nm tungsten nanowire. Journal of Applied Physics 100 (11) : -. ScholarBank@NUS Repository.
Abstract: We report the field-emission properties of ultrathin tungsten nanowires of 5 nm diameter and several hundred nanometer length. Fowler-Nordheim plots of field-emission current-voltage measurements of such nanowires show marked deviation from linearity. After flashing, cold-field-emission current stability with standard deviation of better than 1% has been observed for periods of at least 30 min at a vacuum level of 10-9 mbar. Beyond this, field-emission current noise was found to mainly comprise current step jumps and current spikes. At high emission current densities in the order of 106 A cm-2, the noise changes into flicker noise. Field emission at high current density induced surface diffusion and crystallization of the disordered nanowire tip due to temperature rise at the field-emitting tip. Further increase in the emission current density initiated local arc destruction which caused shortening of the nanowire length. © 2006 American Institute of Physics.
Source Title: Journal of Applied Physics
ISSN: 00218979
DOI: 10.1063/1.2400722
Appears in Collections:Staff Publications

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