Please use this identifier to cite or link to this item:
|Title:||Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case|
|Authors:||Yin, W.Y. |
First and second resonance frequencies
On-chip shunt LC interconnect
|Source:||Yin, W.Y., Li, L.W., Pan, S.J., Gan, Y.B. (2004-05). Experimental characterization of on-chip inductor and capacitor interconnect: Part II. Shunt case. IEEE Transactions on Magnetics 40 (3) : 1657-1663. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2004.826627|
|Abstract:||We present a wide-band experimental characterization of an on-chip shunt inductor and capacitor (LC) interconnect. (A previous paper by the authors considered the series LC case). In order to capture the effects of parasitic parameters on the wide-band transmission and reflection characteristics of shunt LC interconnects, we propose a generalized frequency-independent circuit model for fast-running simulations. The model is accurate to above its second resonant frequency, with low average simulation errors for both reflection and transmission coefficients compared to the measured two-port S parameters over the frequency range of 1 to 14 GHz.|
|Source Title:||IEEE Transactions on Magnetics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Feb 15, 2018
checked on Feb 19, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.