Please use this identifier to cite or link to this item:
|Title:||Evaluating the electrical properties of silicon wafer solar cells using hyperspectral imaging of luminescence|
Sern Lew, J.
|Citation:||Peloso, M.P., Sern Lew, J., Trupke, T., Peters, M., Utama, R., Aberle, A.G. (2011-11-28). Evaluating the electrical properties of silicon wafer solar cells using hyperspectral imaging of luminescence. Applied Physics Letters 99 (22) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3664134|
|Abstract:||A line-imaging spectrometer is used to collect the spectrum of electroluminescence at each point of a multicrystalline silicon wafer solar cell. Characterization of the diffusion lengths of minority charge carriers is developed using a specific feature of the luminescence spectral signature. It is shown that various material and device parameters affecting the luminescence spectral signature may be determined independently. Diffusion length images derived from the proposed hyperspectral method are assessed against diffusion lengths obtained by light beam induced current measurements. Using hyperspectral imaging, diffusion lengths of minority charge carriers in a silicon wafer solar cell can be determined. © 2011 American Institute of Physics.|
|Source Title:||Applied Physics Letters|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on May 22, 2018
WEB OF SCIENCETM
checked on May 7, 2018
checked on Feb 25, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.