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|Title:||Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscope|
|Authors:||Thong, J.T.L. |
|Source:||Thong, J.T.L.,Wong, W.K.,Zainal, A. (2001). Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscope. Scanning 23 (2) : 113-114. ScholarBank@NUS Repository.|
|Appears in Collections:||Staff Publications|
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