Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/55758
Title: Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscope
Authors: Thong, J.T.L. 
Wong, W.K. 
Zainal, A.
Issue Date: 2001
Source: Thong, J.T.L.,Wong, W.K.,Zainal, A. (2001). Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscope. Scanning 23 (2) : 113-114. ScholarBank@NUS Repository.
Source Title: Scanning
URI: http://scholarbank.nus.edu.sg/handle/10635/55758
ISSN: 01610457
Appears in Collections:Staff Publications

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