Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.solmat.2011.05.022
Title: Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current
Authors: Meng, L.
Nagalingam, D. 
Bhatia, C.S. 
Street, A.G.
Phang, J.C.H. 
Keywords: Electrical defect
Electron Beam Induced Current
Morphological defect
Scanning Electron Acoustic Microscopy
Solar cell
Issue Date: Sep-2011
Source: Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H. (2011-09). Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current. Solar Energy Materials and Solar Cells 95 (9) : 2632-2637. ScholarBank@NUS Repository. https://doi.org/10.1016/j.solmat.2011.05.022
Abstract: Morphological and electrical defects in polycrystalline silicon solar cells are distinguished by scanning electron acoustic microscopy (SEAM) and electron beam induced current (EBIC) techniques, respectively. It was found that while some defects are both morphologically and electrically detectable, some are predominantly only either electrical or morphological in nature. Combining both SEAM and EBIC is therefore an ideal approach as the two techniques can provide complementary information on both the morphological and electrical manifestation of the defects. © 2011 Elsevier B.V.
Source Title: Solar Energy Materials and Solar Cells
URI: http://scholarbank.nus.edu.sg/handle/10635/55673
ISSN: 09270248
DOI: 10.1016/j.solmat.2011.05.022
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