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|Title:||Current inhomogeneity effect in single-layer ferromagnetic antirectangular structures|
|Authors:||Wang, C.C. |
|Citation:||Wang, C.C., Adeyeye, A.O., Wu, Y.H., Jalil, M.B.A. (2005-01-15). Current inhomogeneity effect in single-layer ferromagnetic antirectangular structures. Journal of Applied Physics 97 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1828608|
|Abstract:||The magnetotransport properties of antirectangular arrays (2×10 μ m2) embedded into 200-Å -thick continuous Ni80 Fe20 films with the interhole spacing equal to 2 μm have been investigated. We observed that the inhomogeneous current-density distribution, due to the placement of electrical contacts, caused an unusual positive magnetoresistance (MR) behavior for the in-plane longitudinal measurements. Finite element simulations on current-density distribution are in agreement with experimental data on small area antirectangular structures. For the continuous film, however, the current-density distribution does not play a significant role in determining the shape of the MR curve. © 2005 American Institute of Physics.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
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