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|Title:||Correlation of current noise behavior and dark spot formation in organic light-emitting diodes|
Low frequency noise
Organic light emitting diode
|Citation:||Ke, L., Kumar, R.S., Vijila, C., Chua, S.J., Sun, X.W. (2008-01). Correlation of current noise behavior and dark spot formation in organic light-emitting diodes. IEEE Electron Device Letters 29 (1) : 67-69. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2007.910767|
|Abstract:||A correlation between current 1/f noise and dark spot formation is reported. Our results show that the dark spot is primarily correlated to current 1/f noise slope; the higher the slope, the poorer the interface, and the more abnormal dark spot growth rate and the shorter lifetime. Besides, there is a correlation between current 1/f noise magnitude and the dark spot initial size. A higher 1/f noise magnitude generally indicates a larger dark spot initial size. A seemingly identical current-voltage curve does not render the same characteristics of dark spot formation, which can be clearly distinguished from the subtle difference in 1/f noise behavior. The noise measurement can be used to predicate device lifetime and degradation behavior. © 2008 IEEE.|
|Source Title:||IEEE Electron Device Letters|
|Appears in Collections:||Staff Publications|
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