Please use this identifier to cite or link to this item: https://doi.org/10.1109/TPAMI.2008.154
DC FieldValue
dc.titleCorrelation metric for generalized feature extraction
dc.contributor.authorFu, Y.
dc.contributor.authorYan, S.
dc.contributor.authorHuang, T.S.
dc.date.accessioned2014-06-17T02:43:17Z
dc.date.available2014-06-17T02:43:17Z
dc.date.issued2008
dc.identifier.citationFu, Y., Yan, S., Huang, T.S. (2008). Correlation metric for generalized feature extraction. IEEE Transactions on Pattern Analysis and Machine Intelligence 30 (12) : 2229-2235. ScholarBank@NUS Repository. https://doi.org/10.1109/TPAMI.2008.154
dc.identifier.issn01628828
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55455
dc.description.abstractBeyond conventional linear and kernel-based feature extraction, we propose in this paper the generalized feature extraction formulation based on the so-called Graph Embedding framework. Two novel correlation metric based algorithms are presented based on this formulation. Correlation Embedding Analysis (CEA), which incorporates both correlational mapping and discriminating analysis, boosts the discriminating power by mapping data from a high-dimensional hypersphere onto another low-dimensional hypersphere and preserving the intrinsic neighbor relations with local graph modeling. Correlational Principal Component Analysis (CPCA) generalizes the conventional Principal Component Analysis (PCA) algorithm to the case with data distributed on a high-dimensional hypersphere. Their advantages stem from two facts: 1) tailored to normalized data, which are often the outputs from the data preprocessing step, and 2) directly designed with correlation metric, which shows to be generally better than Euclidean distance for classification purpose. Extensive comparisons with existing algorithms on visual classification experiments demonstrate the effectiveness of the proposed methods. © 2008 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TPAMI.2008.154
dc.sourceScopus
dc.subjectCorrelation embedding analysis
dc.subjectCorrelational principal component analysis
dc.subjectFace recognition
dc.subjectFeature extraction
dc.subjectGraph embedding
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TPAMI.2008.154
dc.description.sourcetitleIEEE Transactions on Pattern Analysis and Machine Intelligence
dc.description.volume30
dc.description.issue12
dc.description.page2229-2235
dc.description.codenITPID
dc.identifier.isiut000260033900012
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.