Please use this identifier to cite or link to this item:
https://doi.org/10.1109/TED.2009.2016396
DC Field | Value | |
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dc.title | Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations | |
dc.contributor.author | Zhao, H. | |
dc.contributor.author | Rustagi, S.C. | |
dc.contributor.author | Ma, F.-J. | |
dc.contributor.author | Samudra, G.S. | |
dc.contributor.author | Singh, N. | |
dc.contributor.author | Lo, G.Q. | |
dc.contributor.author | Kwong, D.-L. | |
dc.date.accessioned | 2014-06-17T02:41:21Z | |
dc.date.available | 2014-06-17T02:41:21Z | |
dc.date.issued | 2009 | |
dc.identifier.citation | Zhao, H., Rustagi, S.C., Ma, F.-J., Samudra, G.S., Singh, N., Lo, G.Q., Kwong, D.-L. (2009). Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulations. IEEE Transactions on Electron Devices 56 (5) : 1157-1160. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2009.2016396 | |
dc.identifier.issn | 00189383 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/55287 | |
dc.description.abstract | In this brief, we carried out extensive mixed device and circuit-mode simulations to calibrate the charge-based capacitance measurement technique specifically for subfemtofarad nanowire-based device capacitance. The factors that influence the accuracy of the technique were identified. © 2009 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TED.2009.2016396 | |
dc.source | Scopus | |
dc.subject | Charge-based capacitance measurement (CBCM) technique | |
dc.subject | Nanoscale devices | |
dc.subject | Nanowire MOSFETs | |
dc.subject | Sub-femtofarad capacitance measurements | |
dc.subject | Transient TCAD simulations | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/TED.2009.2016396 | |
dc.description.sourcetitle | IEEE Transactions on Electron Devices | |
dc.description.volume | 56 | |
dc.description.issue | 5 | |
dc.description.page | 1157-1160 | |
dc.description.coden | IETDA | |
dc.identifier.isiut | 000265712400062 | |
Appears in Collections: | Staff Publications |
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